Philippe Leray

According to our database, Philippe Leray authored at least 6 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS.

Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray

CoRR, 2024

2023

Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance.

Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray, Sandip Halder

CoRR, 2023

Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE.

Sara Sacchi, Bappaditya Dey, Iacopo Mochi, Sandip Halder, Philippe Leray

CoRR, 2023

2022

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach.

Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi

CoRR, 2022

Deep Learning-Based Defect Classification and Detection in SEM Images.

Bappaditya Dey, Dipam Goswami, Sandip Halder, Kasem Khalil, Philippe Leray, Magdy A. Bayoumi

CoRR, 2022

2014

Design Technology co-optimization for N10.

Julien Ryckaert, Praveen Raghavan, Rogier Baert, Marie Garcia Bardon, Mircea Dusa, Arindam Mallik, Sushil Sakhare, Boris Vandewalle, Piet Wambacq, Bharani Chava, Kris Croes, Morin Dehan, Doyoung Jang, Philippe Leray, Tsung-Te Liu, Kenichi Miyaguchi, Bertrand Parvais, Pieter Schuddinck, Philippe Weemaes, Abdelkarim Mercha, Jürgen Bömmels, Naoto Horiguchi, Greg McIntyre, Aaron Thean, Zsolt Tökei, Shaunee Cheng, Diederik Verkest, An Steegen

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014