Philippe Leray
Orcid: 0000-0002-1086-270XAffiliations:
- imec, Leuven, Belgium
According to our database1,
Philippe Leray
authored at least 7 papers
between 2014 and 2024.
Collaborative distances:
Collaborative distances:
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2024
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Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
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on orcid.org
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Bibliography
2024
Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review.
IEEE Trans. Artif. Intell., December, 2024
Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS.
CoRR, 2024
2023
Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE.
CoRR, 2023
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance.
Proceedings of the Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2023
2022
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach.
CoRR, 2022
2014
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014