Philippe Leray

Orcid: 0000-0002-1086-270X

Affiliations:
  • imec, Leuven, Belgium


According to our database1, Philippe Leray authored at least 7 papers between 2014 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

2014
2016
2018
2020
2022
2024
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1
2
3
2
1
2
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Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

Online presence:

On csauthors.net:

Bibliography

2024
Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review.
IEEE Trans. Artif. Intell., December, 2024

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS.
CoRR, 2024

2023
Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE.
CoRR, 2023

Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance.
Proceedings of the Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2023

2022
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach.
CoRR, 2022

Deep Learning-Based Defect Classification and Detection in SEM Images.
CoRR, 2022

2014


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