Philippe Dupuy

According to our database, Philippe Dupuy authored at least 11 papers between 2001 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Mechanisms of power module source metal degradation during electro-thermal aging.

R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros

Microelectron. Reliab., 2017

2015

In-depth investigation of metallization aging in power MOSFETs.

R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros

Microelectron. Reliab., 2015

2014

3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions.

Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, Stéphane Lefebvre, Philippe Dupuy

Microelectron. Reliab., 2014

Universal mechanisms of Al metallization ageing in power MOSFET devices.

Donatien Martineau, Colette Levade, Marc Legros, Philippe Dupuy, Thomas Mazeaud

Microelectron. Reliab., 2014

2013

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications.

Gilles Rostaing, Mounira Berkani, D. Mechouche, Denis Labrousse, Stéphane Lefebvre, Zoubir Khatir, Philippe Dupuy

Microelectron. Reliab., 2013

2011

3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs.

Toufik Azoui, Patrick Tounsi, Philippe Dupuy, L. Guillot, Jean-Marie Dorkel

Microelectron. Reliab., 2011

2010

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue.

Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade

Microelectron. Reliab., 2010

2009

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies.

Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve

Microelectron. Reliab., 2009

2007

Characterization and modelling of ageing failures on power MOSFET devices.

B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid

Microelectron. Reliab., 2007

2005

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.

B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin

Microelectron. Reliab., 2005

2001

Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter.

Gerard Coquery, S. Carubelli, Jean-Pierre Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Philippe Dupuy

Microelectron. Reliab., 2001