Philippe Cauvet

According to our database, Philippe Cauvet authored at least 18 papers between 2001 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device.

Anthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzerho, Fabien Soulier, Serge Bernard

J. Sensors, 2017

New Calibration Technique of Contact-less Resonant Biosensor.

Anthony Deluthault, Vincent Kerzerho, Serge Bernard, Fabien Soulier, Philippe Cauvet

J. Electron. Test., 2017

2014

Solutions for the self-adaptation of communicating systems in operation.

Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2011

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics.

Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell

J. Electron. Test., 2011

2009

A multi-converter DFT technique for complex SIP: Concepts and validation.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

Proceedings of the 19th European Conference on Circuit Theory and Design, 2009

2008

Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing.

Emmanuel Simeu, Hoang Nam Nguyen, Philippe Cauvet, Salvador Mir, Libor Rufer, Rafik Khereddine

VLSI Design, 2008

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib

VLSI Design, 2008

Wireless Test Structure for Integrated Systems.

Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard

Proceedings of the 2008 IEEE International Test Conference, 2008

Diagnosis of assembly failures for System-in-Package RF tuners.

Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

2007

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

IET Comput. Digit. Tech., 2007

High throughput non-contact SiP testing.

Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky

Proceedings of the 2007 IEEE International Test Conference, 2007

"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

Proceedings of the 12th European Test Symposium, 2007

System-in-Package, a Combination of Challenges and Solutions.

Philippe Cauvet, Serge Bernard, Michel Renovell

Proceedings of the 12th European Test Symposium, 2007

2006

A First Step for an INL Spectral-Based BIST: The Memory Optimization.

Vincent Kerzerho, Serge Bernard, Philippe Cauvet, Jean-Marie Janik

J. Electron. Test., 2006

A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

IEEE Des. Test Comput., 2006

A Low Cost Alternative Method for Harmonics Estimation in a BIST Context.

Vincent Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, Jean-Marie Janik, B. Agnus, Philippe Cauvet, Ph. Gandy

Proceedings of the 11th European Test Symposium, 2006

2001

Erratum to "Improving the dynamic measurements of ADCs using the 2-ADC method" [Computer standard and interfaces vol. 22 issue 4, 281-286].

Philippe Cauvet

Comput. Stand. Interfaces, 2001

Erratum to "Improving the dynamic measurements of ADC's using the 2-ADC method" [Computer standard and interfaces vol. 22 issue 4, 281-286].

Philippe Cauvet

Comput. Stand. Interfaces, 2001