Philippe Candelier

According to our database1, Philippe Candelier authored at least 15 papers between 2009 and 2018.

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Bibliography

2018
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model.
Proceedings of the 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2018

2016
Clock generator behavioral modeling for supply voltage glitch attack effects analysis.
Microprocess. Microsystems, 2016

2015
On the impact of OxRAM-based synapses variability on convolutional neural networks performance.
Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, 2015

Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Benefit of Al2O3/HfO2 bilayer for BEOL RRAM integration through 16kb memory cut characterization.
Proceedings of the 45th European Solid State Device Research Conference, 2015

2014


Power supply glitch attacks: Design and evaluation of detection circuits.
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014

Detecting positive voltage attacks on CMOS circuits.
Proceedings of the First Workshop on Cryptography and Security in Computing Systems, 2014

Laser attacks on integrated circuits: From CMOS to FD-SOI.
Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

Voltage Glitch Attacks on Mixed-Signal Systems.
Proceedings of the 17th Euromicro Conference on Digital System Design, 2014

2013
Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology.
Proceedings of the International Symposium on Quality Electronic Design, 2013

Power analysis methodology for secure circuits.
Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2009
Review of fuse and antifuse solutions for advanced standard CMOS technologies.
Microelectron. J., 2009


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