Philipp Riess

According to our database, Philipp Riess authored at least 2 papers between 2006 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Reliability aspects of gate oxide under ESD pulse stress.

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix

Microelectron. Reliab., 2009

2006

Dielectric absorption of low-k materials: extraction, modelling and influence on SAR ADCs.

Michael Kropfitsch, Philipp Riess, Gerhard Knoblinger, Dieter Draxelmayr

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006