Petr S. Budyakov
Orcid: 0000-0003-0922-5401
According to our database1,
Petr S. Budyakov
authored at least 13 papers
between 2013 and 2020.
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Bibliography
2020
The Method of Increasing of CMRR for CJFET Dual Differential Input Stages for the Tasks of Processing Sensor Signals Under Conditions of Cryogenic Temperatures and Penetrating Radiation.
Proceedings of the IEEE East-West Design & Test Symposium, 2020
2018
Method for Speeding a Differential Operational Amplifier in the Invert Connection Circuit.
Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018
About Possibility of Magnetooptical/Magnetophotonic Structures Making of Micro- and Nano- Level.
Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018
2017
Research of peak detector limiting characteristics for analog interface in impedance spectroscopy systems.
Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017
2016
Bandpass RC filters of the second-order based on the micropower two-component differential stages.
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016
2014
The synthesis of the correction circuit of the high speed sensors of the physical quantities and current-voltage converters with the parasitic capacitance.
Proceedings of the 2014 East-West Design & Test Symposium, 2014
The correction circuits for the broadband resistive voltage dividers with the capacitive load.
Proceedings of the 2014 East-West Design & Test Symposium, 2014
Proceedings of the 2014 East-West Design & Test Symposium, 2014
Proceedings of the Sixth International Conference on Computational Intelligence, 2014
The Architectures of the Differential Amplifiers on SiGe Bipolar Transistors with Low Voltage Supply.
Proceedings of the Sixth International Conference on Computational Intelligence, 2014
Proceedings of the Sixth International Conference on Computational Intelligence, 2014
Proceedings of the Sixth International Conference on Computational Intelligence, 2014
2013
Proceedings of the East-West Design & Test Symposium, 2013