Peter Vis
Orcid: 0000-0002-8295-8778
According to our database1,
Peter Vis
authored at least 13 papers
between 2016 and 2024.
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Bibliography
2024
A 7.6-mW IR-UWB Receiver Achieving -17-dBm Blocker Resilience With a Linear RF Front-End.
IEEE J. Solid State Circuits, December, 2024
23.5 A 7.6mW IR-UWB Receiver Achieving -13dBm Blocker Resilience with a Linear RF Front-End.
Proceedings of the IEEE International Solid-State Circuits Conference, 2024
A 10V Compliant 16-Channel Stimulator ASIC with sub-10nA Mismatch and Simultaneous ETI Sensing for Selective Vagus Nerve Stimulation.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2024
2023
An 8.7 mW/TX, 21 mW/RX 6-to-9GHz IEEE 802.15.4a/4z Compliant IR-UWB Transceiver with Pulse Pre-Emphasis achieving 14mm Ranging Precision.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
A 380μW IEEE 802.15.4z IR-UWB pulse-mixing transmitter featuring enable-locking RFDCO with extensive duty-cycling in 22nm FDSOI.
Proceedings of the 49th IEEE European Solid State Circuits Conference, 2023
2022
An Injection-Locked Ring-Oscillator-Based Fractional-N Digital PLL Supporting BLE Frequency Modulation.
IEEE J. Solid State Circuits, 2022
Proceedings of the 48th IEEE European Solid State Circuits Conference, 2022
2019
A 769 μW Battery-Powered Single-Chip SoC With BLE for Multi-Modal Vital Sign Monitoring Health Patches.
IEEE Trans. Biomed. Circuits Syst., 2019
A Bio-Impedance Readout IC With Digital-Assisted Baseline Cancellation for Two-Electrode Measurement.
IEEE J. Solid State Circuits, 2019
A 769μW Battery-Powered Single-Chip SoC With BLE for Multi-Modal Vital Sign Health Patches.
Proceedings of the IEEE International Solid- State Circuits Conference, 2019
A Bio-Impedance Readout IC With Digital-Assisted Baseline Cancellation for 2-Electrode Measurement.
Proceedings of the IEEE International Solid- State Circuits Conference, 2019
Proceedings of the 45th IEEE European Solid State Circuits Conference, 2019
2016
Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016