Peter Muhmenthaler

According to our database, Peter Muhmenthaler authored at least 11 papers between 1991 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Session Abstract.

Ajay Khoche, Peter Muhmenthaler

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

New on-Chip DFT and ATE Features for Efficient Embedded Memory Test.

Peter Muhmenthaler

Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006

2005

Compression mode diagnosis enables high volume monitoring diagnosis flow.

Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.

Andreas Leininger, Michael Gössel, Peter Muhmenthaler

Proceedings of the 2004 Design, 2004

2003

Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.

Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Outsourcing Test without Standards?

Peter Muhmenthaler

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Embedded tutorial: TRP: integrating embedded test and ATE.

Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

2000

Tutorial Statement.

Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf

Proceedings of the 2000 Design, 2000

1999

Cost effective testing of systems on silicon: areas for optimization.

Peter Muhmenthaler

Proceedings of the 4th European Test Workshop, 1999

1991

Enhanced fault modeling for DRAM test and analysis.

H.-D. Oberle, M. Maue, Peter Muhmenthaler

Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM.

H.-D. Oberle, Peter Muhmenthaler

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991