Peter Ersland

According to our database, Peter Ersland authored at least 8 papers between 2003 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Reliability validation of compound semiconductor foundry processes.

Peter Ersland, Shivarajiv Somisetty

Microelectron. Reliab., 2012

Editorial.

Peter Ersland, Roberto Menozzi

Microelectron. Reliab., 2012

2009

Determining DC/RF survivability limits of GaAs semiconductor circuits.

C. Gil, Peter Ersland, A. Li

Microelectron. Reliab., 2009

2008

Progress of quantum electronics and the future of wireless technologies.

Samson Mil'shtein, Peter Ersland

Microelectron. J., 2008

2006

Reliability investigation and characterization of failure modes in Schottky diodes.

Shivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason Barrett

Microelectron. Reliab., 2006

2005

Heterojunction semiconductor triode - a new vertical device.

Samson Mil'shtein, C. Gil, Peter Ersland

Microelectron. J., 2005

2004

Lifetime acceleration model for HAST tests of a pHEMT process.

Peter Ersland, Hei-Ruey Jen, Xinxing Yang

Microelectron. Reliab., 2004

2003

p-HEMT with tailored field.

Samson Mil'shtein, Peter Ersland, Shivarajiv Somisetty, C. Gil

Microelectron. J., 2003