Peter Dziel

According to our database, Peter Dziel authored at least 3 papers between 1996 and 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1998

Test Reuse at System Level.

José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

1996

The Need for Complete System Level Test Standardization.

Peter Dziel

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Application of Boundary Scan in a Fault Tolerant Computer System.

Matthew Boutin, Peter Dziel

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996