Pete O'Neill

According to our database, Pete O'Neill authored at least 4 papers between 1999 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation.

Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Reliability Beyond GHz.

Pete O'Neill, Ron Richmond, Mike Tripp, Barbara Vasquez, Art Wager, Zeev Weinberg

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

2000

Current ratios: a self-scaling technique for production IDDQ testing.

Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Current ratios: a self-scaling technique for production I_DDQ testing.

Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999