Pengpeng Ren
Orcid: 0009-0001-2986-9231
According to our database1,
Pengpeng Ren
authored at least 25 papers
between 2015 and 2024.
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Bibliography
2024
High-Throughput Addressable Test Structure Design for Nano-Scaled CMOS Device Characterization.
IEEE Trans. Circuits Syst. II Express Briefs, September, 2024
Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2024
DRGA-Based Second-Order Block Arnoldi Method for Model Order Reduction of MIMO RCS Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap., May, 2024
A strong physical unclonable function with machine learning immunity for Internet of Things application.
Sci. China Inf. Sci., 2024
Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
A Thermal Profile Prediction Methodology for Nanosheet Circuits Featuring Cross-Layer Thermal Coupling Effect.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024
2023
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2023
Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing.
IEEE Access, 2021
2018
Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.
Microelectron. Reliab., 2018
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator.
Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017
2016
Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life.
Proceedings of the International Conference on IC Design and Technology, 2016
2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015