Pavel Poliakov
According to our database1,
Pavel Poliakov
authored at least 4 papers
between 2009 and 2012.
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Bibliography
2012
Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories.
Microelectron. Reliab., 2012
2011
Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness.
Microelectron. Reliab., 2011
2010
IEEE Trans. Circuits Syst. II Express Briefs, 2010
2009
Variability aware modeling of SoCs: From device variations to manufactured system yield.
Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009