Pavan Kumar Javvaji
Orcid: 0000-0003-4678-5934
According to our database1,
Pavan Kumar Javvaji
authored at least 6 papers
between 2017 and 2020.
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Bibliography
2020
Test Pattern Generation and Critical Path Selection in the Presence of Statistical Delays.
IEEE Trans. Very Large Scale Integr. Syst., 2020
2019
On the Sensitization Probability of a Critical Path Considering Process Variations and Path Correlations.
IEEE Trans. Very Large Scale Integr. Syst., 2019
2018
Test set identification for improved delay defect coverage in the presence of statistical delays.
Proceedings of the 19th International Symposium on Quality Electronic Design, 2018
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018
2017
Efficient computation of the sensitization probability of a critical path considering process variations and path correlation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017