Paul R. Chalker
Orcid: 0000-0002-2295-6332
According to our database1,
Paul R. Chalker
authored at least 7 papers
between 2007 and 2019.
Collaborative distances:
Collaborative distances:
Timeline
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Bibliography
2019
The Impact of Etch Depth of D-mode AlGaN/GaN MIS-HEMTs on DC and AC Characteristics of 10 V Input Direct-Coupled FET Logic (DCFL) Inverters.
Proceedings of the International Conference on IC Design and Technology, 2019
Effect of High-k Passivation Layer on Electrical Properties of GaN Metal-Insulator-Semiconductor Devices.
Proceedings of the International Conference on IC Design and Technology, 2019
2015
Proceedings of the 45th European Solid State Device Research Conference, 2015
2007
Charge trapping characterization of MOCVD HfO<sub>2</sub>/p-Si interfaces at cryogenic temperatures.
Microelectron. Reliab., 2007
Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition.
Microelectron. Reliab., 2007
Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition.
Microelectron. Reliab., 2007
Charge trapping and interface states in hydrogen annealed HfO<sub>2</sub>-Si structures.
Microelectron. Reliab., 2007