Paul Layman

According to our database, Paul Layman authored at least 4 papers between 1989 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Statistical modeling of MOS devices for parametric yield prediction.

Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman

Microelectron. Reliab., 2002

2001

SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests.

Qiang Zhang, Juin J. Liou, John McMacken, J. Ross Thomson, Paul Layman

IEEE J. Solid State Circuits, 2001

2000

An efficient and practical MOS statistical model for digital applications.

Qiang Zhang, Juin J. Liou, John McMacken, Kevin Stiles, J. Ross Thomson, Paul Layman

Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

1989

A compact thermal noise model for the investigation of soft error rates in MOS VLSI digital circuits.

Paul Layman, Savvas G. Chamberlain

IEEE J. Solid State Circuits, February, 1989