Paul Jung
Orcid: 0000-0003-0845-5379
According to our database1,
Paul Jung
authored at least 6 papers
between 2021 and 2024.
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Bibliography
2024
Hot-Carrier-Degradation Characterization for Accurate End-of-Life Prediction with 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FET.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Deep Neural Networks with Dependent Weights: Gaussian Process Mixture Limit, Heavy Tails, Sparsity and Compressibility.
J. Mach. Learn. Res., 2023
Over-parameterised Shallow Neural Networks with Asymmetrical Node Scaling: Global Convergence Guarantees and Feature Learning.
CoRR, 2023
Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2021