Paul H. Bardell

VLSI Design, 1993

1992

Calculating the effects of linear dependencies in m-sequences used as test stimuli.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Primitive polynomials of degree 301 through 500.

[BibT_eX]

[DOI]

J. Electron. Test., 1992

Discrete logarithms a parallel pseudorandom pattern generator analysis method.

[BibT_eX]

[DOI]

J. Electron. Test., 1992

1991

Partitioning of polynomial tasks: test generation, an example.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

Production Experience with Built-In Self-Test in the IBM ES/9000 System.

[BibT_eX]

[DOI]

Michael J. Lapointe

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Design considerations for Parallel pseudoRandom Pattern Generators.

[BibT_eX]

[DOI]

J. Electron. Test., 1990

Analysis of cellular automata used as pseudorandom pattern generators.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1988

Built-in test for RAMs.

[BibT_eX]

[DOI]

IEEE Des. Test, 1988

1987

TTTC 10th Anniversary.

[BibT_eX]

[DOI]

IEEE Des. Test, 1987

1986

Pseudorandom Arrays for Built-In Tests.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1986

1985

Self-Test of Random Access Memories.

[BibT_eX]

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Random Pattern Testability.

[BibT_eX]

[DOI]

Gary S. Ditlow

IEEE Trans. Computers, 1984

On Random Pattern Test Length.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1984

Random Testing for Stuck-At Storage Cells in an Embedded Memory.

[BibT_eX]

V. P. Gupta

Proceedings of the Proceedings International Test Conference 1984, 1984

Parallel Pseudorandom Sequences for Built-In Test.

[BibT_eX]

Proceedings of the Proceedings International Test Conference 1984, 1984

1982

Self-Testing of Multichip Logic Modules.

[BibT_eX]