Patrick Trampert
Orcid: 0000-0002-6596-2150
According to our database1,
Patrick Trampert
authored at least 8 papers
between 2015 and 2024.
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Bibliography
2024
Production-Ready End-to-End Visual Quality Inspection for Defect Detection on Surfaces Based on a Multi-Stage AI System.
Proceedings of the 4th International Conference on Image Processing and Vision Engineering, 2024
2023
Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods, 2023
2019
2018
How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?
CoRR, 2018
Proceedings of the IEEE International Conference on Bioinformatics and Biomedicine, 2018
2017
CoRR, 2017
2016
2015