Patrick Tounsi
According to our database1,
Patrick Tounsi
authored at least 16 papers
between 2002 and 2019.
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Bibliography
2019
Development of SiC MOSFET Electrical Model and Experimental Validation: Improvement and Reduction of Parameter Number.
Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019
Using Compact Thermal Modelling for the Investigation of a Cooling System Dysfunction Applied to a Power Module with Double Sided Cooling.
Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019
Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019
2018
New defect detection approach using near electromagnetic field probing of high density PCBAs.
Microelectron. Reliab., 2018
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis.
J. Electron. Test., 2018
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs.
Proceedings of the 27th IEEE North Atlantic Test Workshop, 2018
2013
Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling.
Microelectron. Reliab., 2013
Distributed electrothermal modeling methodology for MOS gated power devices simulations.
Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013
2012
Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations.
Microelectron. Reliab., 2012
Innovative methodology to extract dynamic compact thermal models: Application to power devices.
Microelectron. J., 2012
2011
3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs.
Microelectron. Reliab., 2011
2008
3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET.
Microelectron. Reliab., 2008
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications.
Microelectron. Reliab., 2008
2007
Microelectron. Reliab., 2007
2005
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.
Microelectron. Reliab., 2005
2002
Characterization method of thermomechanical parameters for microelectronic materials.
Microelectron. Reliab., 2002