Patrick Pons
Orcid: 0000-0002-7989-3272
According to our database1,
Patrick Pons
authored at least 36 papers
between 1999 and 2024.
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Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
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on orcid.org
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Bibliography
2024
3-D Printing and Gallium-Based Liquid Metal Technologies for Microwave and Millimeter-Wave Components.
Proc. IEEE, August, 2024
2023
Capacitive Effect and Electromagnetic Coupling on Manganin Gauge Limiting the Bandwidth for Pressure Measurements under Shock Conditions.
Sensors, July, 2023
Sensors, 2023
2022
Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave Monitoring.
Sensors, 2022
Sensors, 2022
2021
Sensors, 2021
2019
Sensors, 2019
Proceedings of the IEEE International Conference on RFID Technology and Applications, 2019
2018
Proceedings of the 15th International Multi-Conference on Systems, Signals & Devices, 2018
Proceedings of the 15th International Multi-Conference on Systems, Signals & Devices, 2018
2016
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016
2013
Wireless sensing and identification based on radar cross section variability measurement of passive electromagnetic sensors.
Ann. des Télécommunications, 2013
2012
Wireless sensing and identification of passive electromagnetic sensors based on millimetre-wave FMCW RADAR.
Proceedings of the 2012 IEEE International Conference on RFID-Technologies and Applications, 2012
2011
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818].
Microelectron. Reliab., 2011
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
Microelectron. Reliab., 2011
2010
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
Microelectron. Reliab., 2010
Methods to improve reliability of bulge test technique to extract mechanical properties of thin films.
Microelectron. Reliab., 2010
2009
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
Microelectron. Reliab., 2009
2008
Microelectron. Reliab., 2008
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
Microelectron. Reliab., 2008
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.
Microelectron. Reliab., 2008
2007
Microelectron. Reliab., 2007
2006
Charging-Effects in RF capacitive switches influence of insulating layers composition.
Microelectron. Reliab., 2006
Microelectron. Reliab., 2006
2005
Microelectron. Reliab., 2005
Microelectron. Reliab., 2005
Microelectron. Reliab., 2005
2004
Microelectron. Reliab., 2004
2003
Microelectron. Reliab., 2003
Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensor.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003
2000
Effect of the silicon membrane flatness defect on the piezoresistive pressure sensor response.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000
1999
Performances and potentialities of a very simple self-compensated pressure sensor demonstrator.
IEEE Trans. Instrum. Meas., 1999
Optimization of a BiCMOS integrated transducer for self-compensated capacitive pressure sensor.
Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999
Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999