Patrick Poirier

According to our database, Patrick Poirier authored at least 8 papers between 2001 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Fast reliability qualification of SiP products.

Charles Regard, Christian Gautier, Hélène Frémont, Patrick Poirier, Xiaosong Ma, Kaspar M. B. Jansen

Microelectron. Reliab., 2009

2008

Determination of temperature change inside IC packages during laser ablation of molding compound.

P. Schwindenhammer, H. Murray, Philippe Descamps, Patrick Poirier

Microelectron. Reliab., 2008

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology.

Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier

Microelectron. Reliab., 2008

Dynamic study of the thermal laser stimulation response on advanced technology structures.

Antoine Reverdy, M. de la Bardonnie, Patrick Poirier, H. Murray, Philippe Perdu, A. Boukkali

Microelectron. Reliab., 2008

2005

Isolating failing sites in IC packages using time domain reflectometry: Case studies.

Dolphin Abessolo-Bidzo, Patrick Poirier, Philippe Descamps, Bernadette Domengès

Microelectron. Reliab., 2005

2004

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti

Microelectron. Reliab., 2004

2002

Comprehensive failure analysis of leakage faults in bipolar transistors.

Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps

Microelectron. Reliab., 2002

2001

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis

Microelectron. Reliab., 2001