Patrick J. McNally

According to our database, Patrick J. McNally authored at least 2 papers between 2006 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages.

Aidan Cowley, Andrej Ivankovic, C. S. Wong, N. S. Bennett, A. N. Danilewsky, Marcel Gonzalez, Vladimir Cherman, Bart Vandevelde, Ingrid De Wolf, Patrick J. McNally

Microelectron. Reliab., 2016

2006

The evaluation of mechanical stresses developed in underlying silicon substrates due to electroless nickel under bump metallization using synchrotron X-ray topography.

D. Noonan, Patrick J. McNally, Weimin Chen, Aapo Lankinen, L. Knuuttila, Turkka O. Tuomi, Andreas N. Danilewsky, Rolf Simon

Microelectron. J., 2006