Patrice Ducharme

According to our database, Patrice Ducharme authored at least 8 papers between 2006 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.

David C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme

J. Electron. Test., 2010

2009

A development platform and electronic modules for automated test up to 20 Gbps.

David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing.

David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop

VLSI Design, 2008

An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test.

David C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid

Proceedings of the 2008 IEEE International Test Conference, 2008

Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications.

David C. Keezer, Dany Minier, Patrice Ducharme

Proceedings of the Design, Automation and Test in Europe, 2008

2007

Multi-GHz loopback testing using MEMs switches and SiGe logic.

David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop

Proceedings of the 2007 IEEE International Test Conference, 2007

Method for reducing jitter in multi-gigahertz ATE.

David C. Keezer, Dany Minier, Patrice Ducharme

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.

David C. Keezer, Dany Minier, Patrice Ducharme

IEEE Des. Test Comput., 2006