Pat Rosno

According to our database, Pat Rosno authored at least 4 papers between 2022 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Low power cryogenic RF ASICs for quantum computing.

David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Chris Baks, John Timmerwilke, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

Proceedings of the IEEE Custom Integrated Circuits Conference, 2023

2022

A Cryo-CMOS Low-Power Semi-Autonomous Transmon Qubit State Controller in 14-nm FinFET Technology.

Sudipto Chakraborty, David J. Frank, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Devin Underwood, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Dorothy Wisnieff, Christian W. Baks, Donald S. Bethune, John Timmerwilke, Thomas Fox, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

IEEE J. Solid State Circuits, 2022

A Cryo-CMOS Low-Power Semi-Autonomous Qubit State Controller in 14nm FinFET Technology.

David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Christian W. Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

Proceedings of the IEEE International Solid-State Circuits Conference, 2022

A Cryo-CMOS Transmon Qubit Controller and Verification with FPGA Emulation.

Kevin Tien, Ken Inoue, Scott Lekuch, David J. Frank, Sudipto Chakraborty, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Devin Underwood, Dorothy Wisnieff, Christian W. Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022