Pascal Raiola
Orcid: 0000-0003-1630-5952
According to our database1,
Pascal Raiola
authored at least 15 papers
between 2016 and 2022.
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Bibliography
2022
PhD thesis, 2022
2021
Proceedings of the Verification, Model Checking, and Abstract Interpretation, 2021
2020
Proceedings of the IEEE European Test Symposium, 2020
2019
Proceedings of the IEEE International Test Conference, 2019
Proceedings of the 24th IEEE European Test Symposium, 2019
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
2018
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.
Proceedings of the 36th IEEE VLSI Test Symposium, 2018
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018
Proceedings of the 23rd IEEE European Test Symposium, 2018
2017
J. Electron. Test., 2017
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model.
Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017
Proceedings of the 18th IEEE Latin American Test Symposium, 2017
Proceedings of the 22nd IEEE European Test Symposium, 2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2016
Proceedings of the Hardware and Software: Verification and Testing, 2016