Pascal Masson

According to our database, Pascal Masson authored at least 16 papers between 2004 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

MOSFET electron mobility enhancement using source/drain recess.

Lucas Antunes Tambara, Paul Devoge, Pascal Masson, Julien Amouroux, Julien Dura, C. Rivero, Franck Julien

Proceedings of the IEEE International Conference on Design, 2024

2023

40nm SONOS Embedded Select in Trench Memory.

Radouane Habhab, Vincenzo Della Marca, Pascal Masson, Nadia Miridi, Clement Pribat, Simon Jeannot, Thibault Kempf, Marc Mantelli, Philippe Lorenzini, Jean-Marc Voisin, Arnaud Régnier, Stephan Niel, Francesco La Rosa

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

Notched gate MOSFET for capacitance reduction in RF SOI technology.

Lucas Antunes Tambara, Pascal Masson, Julien Amouroux, Stéphane Monfray, Julien Dura, Frederic Gianesello, Julien Babic, Romain Debroucke, Loic Welter, Siddhartha Dhar, Bernadette Gros, Clement Charbuillet, Franck Julien, Guillaume Bertrand, Arnaud Régnier, Alain Fleury

Proceedings of the 2023 IEEE International Conference on Design, 2023

2022

A Schmitt trigger to benchmark the performance of a new zero-cost transistor.

Paul Devoge, Hassen Aziza, Philippe Lorenzini, Pascal Masson, Alexandre Malherbe, Franck Julien, Abderrezak Marzaki, Arnaud Régnier, Stephan Niel

Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

2018

Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip.

Thibault Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, Francesco La Rosa, Stephan Niel, Arnaud Régnier, Jean-Michel Portal, Pascal Masson

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Dynamic current reduction of CMOS digital circuits through design and process optimization.

Jordan Innocenti, Loïc Welter, Nicolas Borrel, Franck Julien, Jean-Michel Portal, Jacques Sonzogni, Laurent Lopez, Pascal Masson, Stephan Niel, Philippe Dreux, Julia Castellan

Proceedings of the 25th International Workshop on Power and Timing Modeling, 2015

Layout optimizations to decrease internal power and area in digital CMOS standard cells.

Jordan Innocenti, Franck Julien, Jean-Michel Portal, Laurent Lopez, Q. Hubert, Pascal Masson, Jacques Sonzogni, Stephan Niel, Arnaud Régnier

Proceedings of the 38th International Convention on Information and Communication Technology, 2015

2014

Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology.

Jordan Innocenti, Loic Welter, Franck Julien, Laurent Lopez, Jacques Sonzogni, Stephan Niel, Arnaud Régnier, Emmanuel Paire, Karen Labory, Eric Denis, Jean-Michel Portal, Pascal Masson

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Effect of AC stress on oxide TDDB and trapped charge in interface states.

Benjamin Rebuffat, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Romain Laffont

Proceedings of the 2014 International Symposium on Integrated Circuits (ISIC), 2014

2013

Effect of ions presence in the SiOCH inter metal dielectric structure.

Benjamin Rebuffat, Vincenzo Della Marca, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Olivier Paulet, Laurent Lopez, Romain Laffont

Proceedings of the European Solid-State Device Research Conference, 2013

2012

Effects of 1064 nm laser on MOS capacitor.

R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

Investigation of the effects of constant voltage stress on thin SiO₂ layers using dynamic measurement protocols.

Philippe Chiquet, Pascal Masson, Romain Laffont, Gilles Micolau, Jérémy Postel-Pellerin, Frédéric Lalande, Bernard Bouteille, Jean-Luc Ogier

Microelectron. Reliab., 2012

Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability.

Guillaume Just, Vincenzo Della Marca, Arnaud Régnier, Jean-Luc Ogier, Jérémy Postel-Pellerin, Jean-Michel Portal, Pascal Masson

J. Low Power Electron., 2012

2006

MM11 based flash memory cell model including characterization procedure.

B. Saillet, Arnaud Régnier, Jean-Michel Portal, B. Delsuc, Romain Laffont, Pascal Masson, Rachid Bouchakour

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2005

Characterization and Modeling of Gate-Induced-Drain-Leakage.

Fabien Gilibert, Denis Rideau, Alexandre Dray, Francois Agut, Michel Minondo, Andre Juge, Pascal Masson, Rachid Bouchakour

IEICE Trans. Electron., 2005

2004

A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology.

Sandrine Bernardini, Jean-Michel Portal, Pascal Masson

Proceedings of the 2004 Design, 2004