Paolo Maistri

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Harmonic Response of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection.

[BibT_eX]

[DOI]

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation.

[BibT_eX]

[DOI]

Aghiles Douadi

Luc Salvo

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2024

Modeling Thermal Effects For Biasing PUFs.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2024

Choose your Path: Control of Ring Oscillators EMFI Susceptibility through FPGA P&R Constraints.

[BibT_eX]

[DOI]

Sami El Amraoui

Proceedings of the 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems, 2024

Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification.

[BibT_eX]

[DOI]

Luc Salvo

Laurent Maingault

Guillaume Hubert

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection.

[BibT_eX]

[DOI]

Laurent Maingault

Guillaume Hubert

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Experimental Evaluation of Delayed-Based Detectors Against Power-off Attack.

[BibT_eX]

[DOI]

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable Functions.

[BibT_eX]

[DOI]

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Simulation Methodology for Assessing X-Ray Effects on Digital Circuits.

[BibT_eX]

[DOI]

Guillaume Hubert

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

Microarchitectural Insights into Unexplained Behaviors Under Clock Glitch Fault Injection.

[BibT_eX]

[DOI]

Proceedings of the Smart Card Research and Advanced Applications, 2023

2022

Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions.

[BibT_eX]

[DOI]

IEEE Des. Test, 2022

Electromagnetic Leakage Assessment of a Proven Higher-Order Masking of AES S-Box.

[BibT_eX]

[DOI]

Nicolas Bordes

Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

Variable-Length Instruction Set: Feature or Bug?

[BibT_eX]

[DOI]

Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

X-Ray Fault Injection: Reviewing Defensive Approaches from a Security Perspective.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

A Low-Cost Methodology for EM Fault Emulation on FPGA.

[BibT_eX]

[DOI]

Jiayun Po

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Secure Test with RSNs: Seamless Authenticated Extended Confidentiality.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE International New Circuits and Systems Conference, 2021

Security EDA Extension through P1687.1 and 1687 Callbacks.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2021

Microarchitecture-aware Fault Models: Experimental Evidence and Cross-Layer Inference Methodology.

[BibT_eX]

[DOI]

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2020

Local Clock Glitching Fault Injection with Application to the ASCON Cipher.

[BibT_eX]

[DOI]

G. Surya

Kalpana Senthamarai Kannan

Sriram Sankaran

Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2020

A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System.

[BibT_eX]

[DOI]

Michele Portolan

R. Silveira Feitoza

Ghislain Takam Tchendjou

Vincent Reynaud

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

Dynamic Authentication-Based Secure Access to Test Infrastructure.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2020

2019

A Comprehensive Approach to a Trusted Test Infrastructure.

[BibT_eX]

[DOI]

Proceedings of the 4th IEEE International Verification and Security Workshop, 2019

2018

Hardware Support for Security in the Internet of Things: From Lightweight Countermeasures to Accelerated Homomorphic Encryption.

[BibT_eX]

[DOI]

Asma Mkhinini

Inf., 2018

The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks.

[BibT_eX]

[DOI]

Jean-Max Dutertre

Philippe Candelier

Louis-Barthelemy Faber

Bruno Rouzeyre

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model.

[BibT_eX]

[DOI]

Louis-Barthelemy Faber

Bruno Rouzeyre

Proceedings of the 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2018

2017

HLS design of a hardware accelerator for Homomorphic Encryption.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

2016

Dummy operations in scalar multiplication over elliptic curves: A tradeoff between security and performance.

[BibT_eX]

[DOI]

Simon Pontie

Microprocess. Microsystems, 2016

Analysis of laser-induced errors: RTL fault models versus layout locality characteristics.

[BibT_eX]

[DOI]

Microprocess. Microsystems, 2016

On fault injections for early security evaluation vs. laser-based attacks.

[BibT_eX]

[DOI]

A. Chahed

David Hély

Proceedings of the 1st IEEE International Verification and Security Workshop, 2016

A flexible RNS-based large polynomial multiplier for Fully Homomorphic Encryption.

[BibT_eX]

[DOI]

Proceedings of the 11th International Design & Test Symposium, 2016

HLS-Based Methodology for Fast Iterative Development Applied to Elliptic Curve Arithmetic.

[BibT_eX]

[DOI]

Proceedings of the 2016 Euromicro Conference on Digital System Design, 2016

On the development of a new countermeasure based on a laser attack RTL fault model.

[BibT_eX]

[DOI]

Charalampos Ananiadis

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2015

Polynomial multipliers for fully homomorphic encryption on FPGA.

[BibT_eX]

[DOI]

C. Jayet-Griffon

Marie-Angela Cornelie

Philippe Elbaz-Vincent

Proceedings of the International Conference on ReConFigurable Computing and FPGAs, 2015

Validation of RTL laser fault injection model with respect to layout information.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2015

2014

Electromagnetic analysis and fault injection onto secure circuits.

[BibT_eX]

[DOI]

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser-induced fault effects in security-dedicated circuits.

[BibT_eX]

[DOI]

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser-Induced Fault Effects in Security-Dedicated Circuits.

[BibT_eX]

[DOI]

Bruno Rouzeyre

Clément Tavernier

Proceedings of the VLSI-SoC: Internet of Things Foundations, 2014

Composite fields against side channel analysis for the advanced encryption standard.

[BibT_eX]

[DOI]

Matteo Bollo

Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014

On error models for RTL security evaluations.

[BibT_eX]

[DOI]

David Hély

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

Electromagnetic attacks on embedded devices: A model of probe-circuit power coupling.

[BibT_eX]

[DOI]

Diego Alberto

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

An Elliptic Curve Crypto-Processor Secured by Randomized Windows.

[BibT_eX]

[DOI]

Simon Pontie

Proceedings of the 17th Euromicro Conference on Digital System Design, 2014

A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Randomized windows for secure scalar multiplication on elliptic curves.

[BibT_eX]

[DOI]

Simon Pontie

Proceedings of the IEEE 25th International Conference on Application-Specific Systems, 2014

2013

Forecasting the Effects of Electromagnetic Fault Injections on Embedded Cryptosystems.

[BibT_eX]

[DOI]

Diego Alberto

Inf. Secur. J. A Glob. Perspect., 2013

Countermeasures against EM analysis for a secured FPGA-based AES implementation.

[BibT_eX]

[DOI]

Proceedings of the 2012 International Conference on Reconfigurable Computing and FPGAs, 2013

An evaluation of an AES implementation protected against EM analysis.

[BibT_eX]

[DOI]

Proceedings of the Great Lakes Symposium on VLSI 2013 (part of ECRC), 2013

2011

Glitch and Laser Fault Attacks onto a Secure AES Implementation on a SRAM-Based FPGA.

[BibT_eX]

[DOI]

J. Cryptol., 2011

Countermeasures against fault attacks: The good, the bad, and the ugly.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

10-Gigabit Throughput and Low Area for a Hardware Implementation of the Advanced Encryption Standard.

[BibT_eX]

[DOI]

Proceedings of the 14th Euromicro Conference on Digital System Design, 2011

2010

Dependability analysis of a countermeasure against fault attacks by means of laser shots onto a SRAM-based FPGA.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE International Conference on Application-specific Systems Architectures and Processors, 2010

2009

Pruning single event upset faults with petri nets.

[BibT_eX]

[DOI]

Proceedings of the 10th Latin American Test Workshop, 2009

Towards automated fault pruning with Petri Nets.

[BibT_eX]

[DOI]

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Statistical fault injection: Quantified error and confidence.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Double-Data-Rate Computation as a Countermeasure against Fault Analysis.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 2008

Software Self-Testing of a Symmetric Cipher with Error Detection Capability.

[BibT_eX]

[DOI]

Cyril Excoffon

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Software BIST capabilities of a symmetric cipher.

[BibT_eX]

[DOI]

Cyril Excoffon

Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

2007

An Operation-Centered Approach to Fault Detection in Symmetric Cryptography Ciphers.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 2007

A Novel Double-Data-Rate AES Architecture Resistant against Fault Injection.

[BibT_eX]

[DOI]

Proceedings of the Fourth International Workshop on Fault Diagnosis and Tolerance in Cryptography, 2007

Evaluation of Register-Level Protection Techniques for the Advanced Encryption Standard by Multi-Level Fault Injections.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

2006

Cryptographic algorithms and architectures and their connections with errors and reliability.

[BibT_eX]

[DOI]

PhD thesis, 2006

A Note on Error Detection in an RSA Architecture by Means of Residue Codes.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Incorporating Error Detection in an RSA Architecture.

[BibT_eX]

[DOI]

Proceedings of the Fault Diagnosis and Tolerance in Cryptography, 2006

A Fault Attack Against the FOX Cipher Family.

[BibT_eX]

[DOI]

Proceedings of the Fault Diagnosis and Tolerance in Cryptography, 2006

2005

Incorporating Error Detection and Online Reconfiguration into a Regular Architecture for the Advanced Encryption Standard.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004

An Efficient Hardware-Based Fault Diagnosis Scheme for AES: Performances and Cost.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

Detecting Faults in Four Symmetric Key Block Ciphers.

[BibT_eX]

[DOI]