Panyu Li
Orcid: 0000-0003-2819-679XTimeline
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Bibliography
2022
Error Calibration Method Based on Perspective Mapping for Wafer Automatic Optical Inspection System.
IEEE Trans. Instrum. Meas., 2022
A coarse-to-fine angle automatic correction method for glassivation passivation parts wafer.
Proceedings of the Fifteenth International Conference on Machine Vision, 2022