Panagiota Papavramidou

According to our database, Panagiota Papavramidou authored at least 11 papers between 2012 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Reducing Power Dissipation in Memory Repair for High Fault Rates.

Panagiota Papavramidou, Michael Nicolaidis

IEEE Trans. Very Large Scale Integr. Syst., December, 2023

2020

Iterative Diagnosis Approach for ECC-Based Memory Repair.

Panagiota Papavramidou, Michael Nicolaidis

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM.

Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

2016

Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS.

Panagiota Papavramidou, Michael Nicolaidis

IEEE Trans. Computers, 2016

Memory repair for high fault rates.

Panagiota Papavramidou

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Memory repair for high defect densities.

Michael Nicolaidis, Panagiota Papavramidou

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Low-power memory repair for high defect densities.

Panagiota Papavramidou, Michael Nicolaidis

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

2013

An iterative diagnosis approach for ECC-based memory repair.

Panagiota Papavramidou, Michael Nicolaidis

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Transparent BIST for ECC-based memory repair.

Michael Nicolaidis, Panagiota Papavramidou

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

Reducing power dissipation in memory repair for high defect densities.

Panagiota Papavramidou, Michael Nicolaidis

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Test algorithms for ECC-based memory repair in nanotechnologies.

Panagiota Papavramidou, Michael Nicolaidis

Proceedings of the 30th IEEE VLSI Test Symposium, 2012