P. Mora

According to our database, P. Mora authored at least 5 papers between 1994 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation.

P. Mora, X. Federspiel, Florian Cacho, Vincent Huard, Wafa Arfaoui

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment.

A. Bezza, M. Rafik, David Roy, X. Federspiel, P. Mora, Cheikh Diouf, Vincent Huard, Gérard Ghibaudo

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2011

Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies.

Franck Arnaud, L. Pinzelli, C. Gallon, M. Rafik, P. Mora, Frédéric Boeuf

Microelectron. Reliab., 2011

1995

Color set selection for nominal coding by Hopfield networks.

Paola Campadelli, P. Mora, Raimondo Schettini

Vis. Comput., 1995

1994

Using Hopfield networks in the nominal color coding of classified images.

Paola Campadelli, P. Mora, Raimondo Schettini

Proceedings of the 12th IAPR International Conference on Pattern Recognition, 1994