P. Mialhe

According to our database, P. Mialhe authored at least 5 papers between 2005 and 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2008

A junction characterization for microelectronic devices quality and reliability.

W. Tazibt, P. Mialhe, J. P. Charles, M. A. Belkhir

Microelectron. Reliab., 2008

Switching times variation of MOSFET devices with temperature and high-field stress.

R. Habchi, C. Salame, R. El Bitar, P. Mialhe

Microelectron. J., 2008

2007

Switching times variation of power MOSFET devices after electrical stress.

R. Habchi, C. Salame, P. Mialhe, A. Khoury

Microelectron. Reliab., 2007

Carriers temperature for an operating silicon p-n junction.

M. H. Boukhatem, M. El Tahchi, G. W. El Haj Moussa, M. Ajaka, A. Khoury, P. Mialhe

Microelectron. J., 2007

2005

Study and development of a silicon infrared diode operating under forward bias.

M. El Tahchi, E. Nassar, P. Mialhe

Microelectron. J., 2005