P. J. Liao

According to our database, P. J. Liao authored at least 7 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach.

H. C. Chang, P. J. Liao, S. H. Chen, Y. K. Chang, C. P. Li, W. C. Liao, M. H. Hsieh, H. W. Yang, J. H. Lee, C. M. Huang, Jun He

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation.

P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.

Y. K. Chang, P. J. Liao, S. H. Yeong, Y.-M. Lin, J. H. Lee, C. T. Lin, Z. Yu, Wilman Tsai, Paul C. McIntyre

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector.

P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Composition Segregation of Ge-Rich GST and Its Effect on Reliability.

Yung-Huei Lee, P. J. Liao, Vincent Hou, Dawei Heh, Chih-Hung Nien, Wen-Hsien Kuo, Gary T. Chen, Shao-Ming Yu, Yu-Sheng Chen, Jau-Yi Wu, Xinyu Bao, Carlos H. Diaz

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates.

Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Study of dynamic TDDB in scaled FinFET technologies.

Kaustubh Joshi, Shu-Wen Chang, D. S. Huang, P. J. Liao, Yung-Huei Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2018