P. C. Lin

According to our database, P. C. Lin authored at least 4 papers between 2002 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

An investigation into warpages, stresses and keep-out zone in 3D through-silicon-via DRAM packages.

Ming-Yi Tsai, P. S. Huang, C. Y. Huang, P. C. Lin, Lawrence Huang, Michael Chang, Steven Shih, J. P. Lin

Microelectron. Reliab., 2014

2009

Assessing non-normally distributed processes by interval estimation of the incapability index C_pp.

Jau-Chuan Ke, Yunn-Kuang Chu, Y.-T. Chung, P. C. Lin

Qual. Reliab. Eng. Int., 2009

2004

Testing process performance based on capability index C_pk with critical values.

Wen Lea Pearn, P. C. Lin

Comput. Ind. Eng., 2004

2002

Testing process capability for one-sided specification limit with application to the voltage level translator.

P. C. Lin, Wen Lea Pearn

Microelectron. Reliab., 2002