P. Beno

According to our database, P. Beno authored at least 2 papers between 2007 and 2012.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2012

Analysis of reliability and optimization of ESD protection devices supported by modeling and simulation.

Ales Chvála, Daniel Donoval, P. Beno, Juraj Marek, Patrik Pribytny, Marian Molnar

Microelectron. Reliab., 2012

2007

Simulation of boron diffusion in Si and strained SiGe layers.

R. Kinder, F. Schwierz, P. Beno, J. Geßner

Microelectron. J., 2007