Owen Farnsworth

According to our database, Owen Farnsworth authored at least 5 papers between 2001 and 2003.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2003

An On-Chip Self-Repair Calculation and Fusing Methodology.

Darren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater

IEEE Des. Test Comput., 2003

2002

Extending OPMISR beyond 10x Scan Test Efficiency.

Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera

IEEE Des. Test Comput., 2002

On-Chip Repair and an ATE Independent Fusing Methodology.

Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

OPMISR: the foundation for compressed ATPG vectors.

Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

A SmartBIST Variant with Guaranteed Encoding.

Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001