Owain Parry
Orcid: 0000-0002-0917-1274
According to our database1,
Owain Parry
authored at least 9 papers
between 2020 and 2024.
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Bibliography
2024
ACM SIGSOFT Softw. Eng. Notes, July, 2024
CoRR, 2024
Proceedings of the 46th IEEE/ACM International Conference on Software Engineering, 2024
2023
Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models.
Empir. Softw. Eng., June, 2023
2022
Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests.
Proceedings of the 15th IEEE Conference on Software Testing, Verification and Validation, 2022
Proceedings of the 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, 2022
What Do Developer-Repaired Flaky Tests Tell Us About the Effectiveness of Automated Flaky Test Detection?
Proceedings of the IEEE/ACM International Conference on Automation of Software Test, 2022
2020
Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness.
Proceedings of the ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June, 2020