Owain Parry

Orcid: 0000-0002-0917-1274

According to our database1, Owain Parry authored at least 9 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2024
Summary of the 1st International Flaky Test Workshop (FTW 2024).
ACM SIGSOFT Softw. Eng. Notes, July, 2024

Improving the Reliability of Quantum Circuits by Evolving Heterogeneous Ensembles.
CoRR, 2024

Do Automatic Test Generation Tools Generate Flaky Tests?
Proceedings of the 46th IEEE/ACM International Conference on Software Engineering, 2024

2023
Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models.
Empir. Softw. Eng., June, 2023

2022
A Survey of Flaky Tests.
ACM Trans. Softw. Eng. Methodol., 2022

Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests.
Proceedings of the 15th IEEE Conference on Software Testing, Verification and Validation, 2022

Surveying the Developer Experience of Flaky Tests.
Proceedings of the 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, 2022

What Do Developer-Repaired Flaky Tests Tell Us About the Effectiveness of Automated Flaky Test Detection?
Proceedings of the IEEE/ACM International Conference on Automation of Software Test, 2022

2020
Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness.
Proceedings of the ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June, 2020


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