Osei Poku

According to our database, Osei Poku authored at least 13 papers between 2006 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

PADRE: Physically-Aware Diagnostic Resolution Enhancement.

Yang Xue, Osei Poku, Xin Li, Ronald D. Blanton

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Physically-Aware N-Detect Test.

Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.

R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku

IEEE Des. Test Comput., 2012

Test-data volume optimization for diagnosis.

Hongfei Wang, Osei Poku, Xiaochun Yu, Sizhe Liu, Ibrahima Komara, Ronald D. Blanton

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2010

Systematic defect identification through layout snippet clustering.

Wing Chiu Tam, Osei Poku, Ronald D. Blanton

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Controlling DPPM through Volume Diagnosis.

Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Automated failure population creation for validating integrated circuit diagnosis methods.

Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton

Proceedings of the 46th Design Automation Conference, 2009

2008

Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon.

Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar

Proceedings of the 2008 IEEE International Test Conference, 2008

Physically-Aware N-Detect Test Pattern Selection.

Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton

Proceedings of the Design, Automation and Test in Europe, 2008

Precise failure localization using automated layout analysis of diagnosis candidates.

Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton

Proceedings of the 45th Design Automation Conference, 2008

2007

Delay defect diagnosis using segment network faults.

Osei Poku, Ronald D. Blanton

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Extracting Defect Density and Size Distributions from Product ICs.

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer

IEEE Des. Test Comput., 2006

A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior.

Rao Desineni, Osei Poku, Ronald D. Blanton

Proceedings of the 2006 IEEE International Test Conference, 2006