Oriol Avino-Salvado
Orcid: 0000-0003-3099-3827
According to our database1,
Oriol Avino-Salvado
authored at least 9 papers
between 2014 and 2024.
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Bibliography
2024
Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs.
IEEE Trans. Ind. Electron., May, 2024
Measurement Uncertainty in Fourier Coefficient- Based Time Series Reconstruction Considering Calibration Effects in Thermal Imaging.
IEEE Trans. Instrum. Meas., 2024
2023
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics.
IEEE Trans. Instrum. Meas., 2023
2021
IEEE Trans. Ind. Electron., 2021
2019
VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode.
Microelectron. Reliab., 2018
2017
Microelectron. Reliab., 2017
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling.
Microelectron. Reliab., 2017
2014
Simplified Mathematical Model for Calculating the Oxygen Excess Ratio of a PEM Fuel Cell System in Real-Time Applications.
IEEE Trans. Ind. Electron., 2014