Om Prakash

According to our database, Om Prakash authored at least 17 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning.

Om Prakash, Rodion Novkin, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Ramesh Karri, Farshad Khorrami, Hussam Amrouch

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness.

Om Prakash, Kai Ni, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing.

Om Prakash, Kai Ni, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications.

Kai Ni, Om Prakash, Simon Thomann, Zijian Zhao, Shan Deng, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.

Navjeet Bagga, Kai Ni, Nitanshu Chauhan, Om Prakash, X. Sharon Hu, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology.

Om Prakash, Nitanshu Chauhan, Aniket Gupta, Hussam Amrouch

Microelectron. J., 2021

On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM.

Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Transistor Self-Heating: The Rising Challenge for Semiconductor Testing.

Om Prakash, Chetan K. Dabhi, Yogesh Singh Chauhan, Hussam Amrouch

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.

Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Variability Effects in FinFET Transistors and Emerging NC-FinFET.

Aniket Gupta, Nitanshu Chauhan, Om Prakash, Hussam Amrouch

Proceedings of the International Conference on IC Design and Technology, 2021

2020

Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology.

Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Chetan K. Dabhi, Florian Klemme, Om Prakash, Yogesh Singh Chauhan

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET.

Aniket Gupta, Kai Ni, Om Prakash, Xiaobo Sharon Hu, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Radiation on Negative Capacitance FinFET.

Govind Bajpai, Aniket Gupta, Om Prakash, Girish Pahwa, Jörg Henkel, Yogesh Singh Chauhan, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET.

Kai Ni, Aniket Gupta, Om Prakash, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of NBTI Aging on Self-Heating in Nanowire FET.

Om Prakash, Hussam Amrouch, Sanjeev Manhas, Jörg Henkel

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology.

Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Reliability Challenges with Self-Heating and Aging in FinFET Technology.

Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019