Olivier Weber

According to our database, Olivier Weber authored at least 15 papers between 2009 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Unlimited Bi-directional Back-Bias in FD-SOI Technology With New Dual Isolation Integration.

R. Berthelon, Olivier Weber, F. Ibars, B. Revel, C. Borowiak, J. C. Grenier, B. Dumont, S. Desmoulins, P. O. Sassoulas, P. Ferreira, S. Chouteau, S. Niel, Rossella Ranica, R. Gonella, Franck Arnaud

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

An 18nm ePCM with BJT selector NVM design for advanced microcontroller applications.

Antonino Conte, Francesco Tomaiuolo, Marco Ruta, Andrea Redaelli, Franck Arnaud, Thomas Jouanneau, Christian Boccaccio, Olivier Weber

Proceedings of the IEEE International Memory Workshop, 2023

Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress.

Xinze Li, Yuxuan Wu, Qiao Teng, Ying Sun, Xiao Gong, Guillaume Besnard, Christophe Maleville, Olivier Weber, Rui Zhang, Bing Chen, Dawei Gao, Ran Cheng

Proceedings of the International Conference on IC Design and Technology, 2023

2021

16MB High Density Embedded PCM macrocell for automotive-grade microcontroller in 28nm FD-SOI, featuring extension to 24MB for Over-The-Air software update.

Fabio Disegni, A. Ventre, A. Molgora, Paolo Cappelletti, R. Badalamenti, P. Ferreira, G. Castagna, Andreia Cathelin, Anna Gandolfo, Andrea Redaelli, D. Manfrè, Alfonso Maurelli, C. Torti, F. Piazza, M. Carfì, Franck Arnaud, M. Perroni, M. Caruso, S. Pezzini, Roberto Annunziata, G. Piazza, Olivier Weber, M. Peri

Proceedings of the 2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, 2021

Improving Ge-rich GST ePCM reliability through BEOL engineering.

Andrea Redaelli, Anna Gandolfo, Giulia Samanni, Enrico Gomiero, Elisa Petroni, Luca Scotti, Andrea Lippiello, Paolo Mattavelli, J. Jasse, D. Codegoni, A. Serafini, Rossella Ranica, Christian Boccaccio, Jury Sandrini, R. Berthelon, J. C. Grenier, Olivier Weber, David Turgis, A. Valery, S. Del Medico, V. Caubet, J. P. Reynard, Didier Dutartre, L. Favennec, Antonino Conte, Fabio Disegni, M. De Tomasi, A. Ventre, Matteo Baldo, Daniele Ielmini, Alfonso Maurelli, P. Ferreira, Franck Arnaud, F. Piazza, Paolo Cappelletti, Roberto Annunziata, R. Gonella

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

2019

Embedded PCM macro for automotive-grade microcontroller in 28nm FD-SOI.

Fabio Disegni, Roberto Annunziata, A. Molgora, G. Campardo, Paolo Cappelletti, P. Zuliani, P. Ferreira, A. Ventre, G. Castagna, Andreia Cathelin, Anna Gandolfo, F. Goller, S. Malhi, D. Manfrè, Alfonso Maurelli, C. Torti, Franck Arnaud, M. Carfì, M. Perroni, M. Caruso, S. Pezzini, G. Piazza, Olivier Weber, M. Peri

Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019

28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital, Analog, Automotive and others Applications.

Franck Arnaud, Sébastien Haendler, Sylvain Clerc, Rossella Ranica, Anna Gandolfo, Olivier Weber

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2017

FDSOI vs FinFET: differentiating device features for ultra low power & IoT applications.

Olivier Weber

Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

2016

28nm FDSOI technology sub-0.6V SRAM Vmin assessment for ultra low voltage applications.

Rossella Ranica, Nicolas Planes, Vincent Huard, Olivier Weber, Daniel Noblet, Damien Croain, Fabien Giner, Sylvie Naudet, P. Mergault, S. Ibars, A. Villaret, Maryline Parra, Sébastien Haendler, M. Quoirin, Florian Cacho, C. Julien, F. Terrier, Lorenzo Ciampolini, David Turgis, Christophe Lecocq, Franck Arnaud

Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

2015

Static and dynamic power management in 14nm FDSOI technology.

Olivier Weber, Emmanuel Josse, J. Mazurier, Michel Haond

Proceedings of the 2015 International Conference on IC Design & Technology, 2015

Effective work function engineering by sacrificial lanthanum diffusion on HfON-based 14 nm NFET devices.

Carlos Suarez-Segovia, Charles Leroux, Florian Domengie, Karen Dabertrand, Vincent Joseph, Giovanni Romano, Pierre Caubet, Stephane Zoll, Olivier Weber, Gérard Ghibaudo, Gilles Reimbold, Michel Haond

Proceedings of the 45th European Solid State Device Research Conference, 2015

2014

Variability of planar Ultra-Thin Body and Buried oxide (UTBB) FDSOI MOSFETs.

J. Mazurier, Olivier Weber, François Andrieu, Cyrille Le Royer, Olivier Faynot, Maud Vinet

Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

Strain and layout management in dual channel (sSOI substrate, SiGe channel) planar FDSOI MOSFETs.

François Andrieu, Mikaël Cassé, E. Baylac, P. Perreau, O. Nier, Denis Rideau, R. Berthelon, Franck Pourchon, A. Pofelski, Barbara De Salvo, C. Gallon, Vincent Mazzocchi, D. Barge, C. Gaumer, O. Gourhant, A. Cros, Vincent Barral, Rossella Ranica, Nicolas Planes, Walter Schwarzenbach, E. Richard, Emmanuel Josse, Olivier Weber, Franck Arnaud, Maud Vinet, Olivier Faynot, Michel Haond

Proceedings of the 44th European Solid State Device Research Conference, 2014

2012

Ultra-Thin Body and Buried Oxide (UTBB) FDSOI Technology with Low Variability and Power Management Capability for 22 nm Node and Below.

J. Mazurier, Olivier Weber, François Andrieu, Alain Toffoli, Olivier Thomas, Fabienne Allain, Jean-Philippe Noel, Marc Belleville, Olivier Faynot, T. Poiroux

J. Low Power Electron., 2012

2009

Impact of a 10nm Ultra-Thin BOX (UTBOX) and Ground Plane on FDSOI devices for 32nm node and below.

Claire Fenouillet-Béranger, P. Perreau, S. Denorme, L. Tosti, François Andrieu, Olivier Weber, S. Barnola, C. Arvet, Y. Campidelli, Sébastien Haendler, R. Beneyton, C. Perrot, C. de Buttet, P. Gros, Loan Pham-Nguyen, F. Leverd, P. Gouraud, F. Abbate, F. Baron, A. Torres, C. Laviron, L. Pinzelli, J. Vetier, C. Borowiak, A. Margain, D. Delprat, F. Boedt, Konstantin Bourdelle, Bich-Yen Nguyen, Olivier Faynot, Thomas Skotnicki

Proceedings of the 35th European Solid-State Circuits Conference, 2009