Olivier Ginez

According to our database, Olivier Ginez authored at least 10 papers between 2006 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Design challenges for prototypical and emerging memory concepts relying on resistance switching.

Christophe Muller, Damien Deleruyelle, Olivier Ginez, Jean-Michel Portal, Marc Bocquet

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2009

A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash.

Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel

J. Electron. Test., 2009

Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections.

Olivier Ginez, Jean-Michel Portal, Christophe Muller

Proceedings of the 14th IEEE European Test Symposium, 2009

An on-line testing scheme for repairing purposes in Flash memories.

Olivier Ginez, Jean-Michel Portal, Hassen Aziza

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009

2008

A Novel Low Power Oriented Design Methodology for Analog Blocks.

Hassen Aziza, Emmanuel Bergeret, Jean-Michel Portal, Olivier Ginez

J. Low Power Electron., 2008

A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories.

Olivier Ginez, Jean-Michel Portal, Hassen Aziza

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window.

Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

A concurrent approach for testing address decoder faults in eFlash memories.

Olivier Ginez, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Jean Michel Daga

Proceedings of the 2007 IEEE International Test Conference, 2007

Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories.

Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 12th European Test Symposium, 2007

2006

An Overview of Failure Mechanisms in Embedded Flash Memories.

Olivier Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006