Olivier Crépel

According to our database, Olivier Crépel authored at least 9 papers between 2002 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs lifetime by Reliability Tests.

Fabio Principato, Giuseppe Allegra, Corrado Cappello, Olivier Crépel, Nicola Nicosia, Salvatore D'Arrigo, Vincenzo Cantarella, Alessandro Di Mauro, Leonardo Abbene, Marcello Mirabello, Francesco Pintacuda

Sensors, 2021

2018

Radiation robustness of normally-off GaN/HEMT power transistors (COTS).

Moustafa Zerarka, Olivier Crépel

Microelectron. Reliab., 2018

2013

Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model.

André Durier, Christian Marot, Olivier Crépel

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2012

Test methodology of a new upset mechanism induced by protons in deep sub-micron devices.

Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard

Microelectron. Reliab., 2012

2008

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.

Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis

Microelectron. Reliab., 2008

2004

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti

Microelectron. Reliab., 2004

2003

Magnetic emission mapping for passive integrated components characterisation.

Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina

Microelectron. Reliab., 2003

2002

Magnetic field measurements for Non Destructive Failure Analysis.

Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali

Microelectron. Reliab., 2002

Backside Hot Spot Detection Using Liquid Crystal Microscopy.

Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2002