Oleg Semenov
According to our database1,
Oleg Semenov
authored at least 17 papers
between 2002 and 2014.
Collaborative distances:
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Bibliography
2014
Proceedings of the Evolution, Complexity and Artificial Life, 2014
2013
Proceedings of the Twelfth European Conference on the Synthesis and Simulation of Living Systems: Advances in Artificial Life, 2013
2011
Circuits Syst., 2011
Новые возможности поиска и графического представления информации базы данных по основным параметрам гигантского дипольного резонанса ядер (New Abilities in Search and Graphical Presentation for Information on the Main Parameters of Giant Dipole Resonance of Atomic Nuclei Data Base).
Proceedings of the 13th All-Russian Scientific Conference "Digital libraries: Advanced Methods and Technologies, 2011
Multiple Molecular Spiders with a Single Localized Source - The One-Dimensional Case - (Extended Abstract).
Proceedings of the DNA Computing and Molecular Programming - 17th International Conference, 2011
2007
Temperature dependence of I<sub>DDQ</sub> distribution: application for thermal delta I<sub>DDQ</sub> testing.
IET Circuits Devices Syst., 2007
Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007
2006
Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices.
Microelectron. J., 2006
Proceedings of the IEEE 17th International Symposium on Personal, 2006
2005
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005
2004
The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness.
Microelectron. Reliab., 2004
Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET.
Microelectron. Reliab., 2004
2003
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta <i>I</i><sub>DDQ</sub> Testing.
J. Electron. Test., 2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003
2002
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002