Olaf Zimmerhackl

According to our database, Olaf Zimmerhackl authored at least 4 papers between 2018 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance.

Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, Michael Otto, Alban Zaka, Jan Hoentschel

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices.

Luca Pirro, Aarthi Jayakumar, Olaf Zimmerhackl, Dieter Lipp, Ralf Illgen, Armin Muehlhoff, Ronny Pfuetzner, Alban Zaka, Michael Otto, Jan Hoentschel, Yannick Raffel, Konrad Seidel, Ricardo Olivo

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias.

Luca Pirro, Alban Zaka, Olaf Zimmerhackl, T. Hermann, Michael Otto, E. M. Bazizi, Jan Hoentschel, X. Li, R. Taylor

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

RTN and LFN Noise Performance in Advanced FDSOI Technology.

Luca Pirro, Olaf Zimmerhackl, Alban Zaka, Lars Müller-Meskamp, Ranjith Nelluri, Tom Hermann, Ignasi Cortes-Mayol, Andreas Huschka, Michael Otto, E. Nowak, Anurag Mittal, Jan Hoentschel

Proceedings of the 48th European Solid-State Device Research Conference, 2018