O. V. Dvornikov
Orcid: 0000-0002-6632-429X
According to our database1,
O. V. Dvornikov
authored at least 12 papers
between 2015 and 2020.
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Bibliography
2020
The Research Methodology of Dependence Mode at Parameters Dispersion of a Differential Pair on Integral JFETs in a Radiation-Hardened Structured Array MH2XA010.
Proceedings of the 11th IEEE Latin American Symposium on Circuits & Systems, 2020
Features of JFET Computer Models in Microcurrent Mode on Exposure to Low Temperatures and Neutron Fluence.
Proceedings of the IEEE East-West Design & Test Symposium, 2020
2019
Circuit Features of Multichannel Chips of Reading Electronics of Silicone Photomultiplier Tubes.
Proceedings of the 23rd International Conference on System Theory, Control and Computing, 2019
Parametric Optimization Subsystem in LTspice Environment of Analog Microcircuits for Operation at Low Temperatures.
Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019
Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019
Proceedings of the 49th European Solid-State Device Research Conference, 2019
2018
Research and Design of Differential Gas Temperature Measurement System for Gas-Turbine Engines.
Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018
Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018
2017
Potential of nonlinear parametric zonal systems at development of SubTHz and THz radioelectronics of the future.
Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017
2016
The drivers of the differential communication lines based on radiation-hardened structured array MH2XA010.
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016
The analog array chip AC-1.3 for the tasks of tool engineering in conditions of cryogenic temperature, neutron flux and cumulative radiation dose effects.
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016
2015
The reconfigurable radiation-hardened differential difference operational amplifier and its main connection circuits in sensor systems.
Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015