O. Simonetti

According to our database1, O. Simonetti authored at least 2 papers between 2003 and 2005.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2005
Low voltage SILC and P- and N-MOSFET gate oxide reliability.
Microelectron. Reliab., 2005

2003
Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices.
Microelectron. Reliab., 2003


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