O. Lazar

According to our database¹, O. Lazar authored at least 2 papers between 2015 and 2017.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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2017

Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction of the Schottky Barrier Height, electrical modelling, T-CAD simulations and TEM imaging.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2017

2015

Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2015

O. Lazar

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