O. Bravo

According to our database, O. Bravo authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Cu/low-k dielectric TDDB reliability issues for advanced CMOS technologies.

Fen Chen, O. Bravo, Dave Harmon, Michael A. Shinosky, J. Aitken

Microelectron. Reliab., 2008