O. Benzaim
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Bibliography
2008
Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks.
IEEE Trans. Instrum. Meas., 2008
Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique.
IEEE Trans. Instrum. Meas., 2008